Numerical analysis of vibration modes of a qPlus sensor with a long tip

• Kebei Chen,
• Zhenghui Liu,
• Yuchen Xie,
• Chunyu Zhang,
• Gengzhao Xu,
• Wentao Song and
• Ke Xu

Beilstein J. Nanotechnol. 2021, 12, 82–92, doi:10.3762/bjnano.12.7

• tuning fork and the wiring in the liquid, a longer tip is required. By keeping the nodes of the tip in the higher-order modes close to the liquid surface, the frequency drift of the sensor can be effectively limited, maintaining a high Q factor [16][17]. By using a qPlus sensor with a long tip, atomic

Effective sensor properties and sensitivity considerations of a dynamic co-resonantly coupled cantilever sensor

• Julia Körner

Beilstein J. Nanotechnol. 2018, 9, 2546–2560, doi:10.3762/bjnano.9.237

• frequency drift noise), the measurement principle (e.g., magnetic noise in case of magnetic measurements) and the excitation and detection setup (e.g., oscillator noise, detector noise) [8][20]. However, the lowest limit for a cantilever’s sensitivity is given by its thermal fluctuations leading to a

Advanced atomic force microscopy techniques II

• Thilo Glatzel,
• Ricardo Garcia and
• Thomas Schimmel

Beilstein J. Nanotechnol. 2014, 5, 2326–2327, doi:10.3762/bjnano.5.241

• with real parameters [22]. Furthermore, technical contributions discuss the impact of thermal frequency drift of quartz-based force sensors at low temperatures to the accuracy of the force measurements [23] and the trade-offs in sensitivity and sampling depth in bimodal and trimodal AFM [24]. The

Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures

• Florian Pielmeier,
• Daniel Meuer,
• Daniel Schmid,
• Christoph Strunk and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2014, 5, 407–412, doi:10.3762/bjnano.5.48

• detector noise. Keywords: AFM; frequency drift; length extensional resonator; needle sensor; qPlus sensor; quartz; Findings Frequency modulation atomic force microscopy [1] has become an essential tool for surface scientist‘s to study chemical and magnetic interactions at the atomic scale [2][3][4][5][6

• contributions are significantly reduced and imaging with millihertz resolution becomes possible [12]. In turn, when B is small the stability of the eigenfrequency f0 is particularly important, because frequency drift noise is proportional to 1/ [7]. The main cause of frequency drift are changes in f0 with

• in comparison to silicon cantilevers results in a significantly smaller frequency drift at room temperature [7][10]. The frequency variation with temperature resembles an inverted parabola centered around the turnover temperature, which is usually tuned to about 25 °C [17]. On the other hand, quartz

qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolution

• Maximilian Schneiderbauer,
• Daniel Wastl and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2012, 3, 174–178, doi:10.3762/bjnano.3.18

• corresponds to a magnetic force gradient of 340 μNm−1. At low temperatures we expect that the noise in our MFM measurements will decrease dramatically due to an increase in Q, a decrease in nq (Equation 2–Equation 4), and a decrease in thermal frequency drift, therefore we trust that qPlus sensors will become